...I

``Dashboard: a Knowledge-Based Control System Interface" by De Clarke, to be presented at the 1997 TCL Conference.)

.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.

...dashboard

See Part I, chapter 3.3.

.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.

...observing

Certain types of data will have to be protected, to preserve the privacy of observers' projects and observing plans. Observers will have access to all public data, and all private data pertaining to their own research.

.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.

...spectra

Of course, we do not plan to store actual binary image data in the database, only header information and the URL of the actual image, in this case a FITS image file on local disk.

.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.

...sketch.

The attribute ``context" is available for each major entity in the DEIMOS database, and it means whatever the software engineers want it to mean; it is used merely to ``label" or associate entities for practical purposes. During prototyping and schema development, this generic attribute provides a certain flexibility in coding, and latitude for invention and improvisation. As the schema and applications settle into their final form, the ``context" attribute usually turns out to mean something more concrete. In the case of Paths, this attribute became useful for grouping Paths into ``drawings" of related agents and their function. Each Path context now has an author, title, and so forth. When the great nomenclature cleanup arrives, this attribute of Paths will probably be renamed ``drawing".

.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.

...elements

Except for the analytical mappings in Section 2.2. However, the analytical mappings could be used to generate mappings in the same form described here

.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.

...starlight

Aberration of starlight is maximum in directions tangential to motion. However, the differential aberration is greatest in direction of motion, reaching a maximum of 89#89, where 90#90 is the edge-to-edge angle of the field. For DEIMOS, considering both beams and the radius of the FOV, 91#91 and the differential aberration can reach 92#92 arcsec in virtually any orientation. On the other hand, differential mask alignment between beams A and B can remove a large portion of the effect in the important cross-slit direction.

.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.

...mask

This procedure only works if the mask surface closely approximates the spherical image surface of the telesope. For differences h between the two surfaces, translational errors can reach 100#100. At the extreme ends of the mask, the curvature reaches a difference of 1.3 mm (88#88 = 0.034 arcsec); the amplitude of the deviation between the cylindrical and spherical surfaces is 30#301.4 mm (88#88 = 0.037 arcsec) along the ``flat'' axis. This latter is the more critical, as it is in the ``cross-slit'' direction.

.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.

...ray-tracing

This ray-tracing depends on the telescope focal length, 116#116, and thus is only valid for one value of the focus. However, 116#116 appears to be quite stable - the primary's focal length cannot be changed simply by tilting the segments, and the segments and secondary are all in ``zerodur'' and so should not change shape (T. Mast, priv. comm.)

.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.

...reflectance

Reflectance for a given material depends not only on the wavelength of light, but also the angle of incidence. However, for small variations in incidence angle there is little variation in reflectance, and we ignore this slight dependency throughout this discussion.

.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.

...slope

The slope itself will contain a pitch error for each grating.

.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.

...throughput

from above the atmosphere, as defined.

.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.

...x

If the mapping of 245#245 changes (for example, by resetting the grating in its cell or adjusting pitch angle) then either a new calibration set must be acquired for that grating or the existing one must be corrected.

.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.