The following four chapters provide detailed information about calibrations required to characterize DEIMOS at commissioning, procedures needed to calibrate DEIMOS science data, products that will be maintained in the DEIMOS database, and instructions for creating those products. These chapters cover:
Engineering calibrations are of little direct interest to the user, but are of considerable importance to the acquisition of high-quality data. The remaining three types of calibrations are referred to as science calibrations, and must be carried out by the user or a data-reduction pipeline. A flowchart of these operations is shown in Figure ??, and a summary of the scince calibration steps/elements is given in the Table. [Figure to be finished...]
Each of the following chapters is organized to provide a description of terms, background information and relevant concerns regarding certain processes, and a brief description of each calibration step. This is followed by a summary of necessary database entries and instructions for how each will be created (the instructions will eventually be turned into coded instrument-control scripts which can be run with little input from the instrument specialist responsible for maintaining the calibration database). Finally, outstanding issues are listed at the end of each chapter.
All calibration procedures and products are required for pipeline mode. We identify two levels of pipeline mode, Phase 1 and Phase 2, as well as a pre-pipeline, Baseline mode. Baseline mode will be delivered at commissioning. We hope to deliver Phase 1 pipeline within one year of commissioning. Phase 2 is somewhat dependent upon the performance of the Phase 1 pipeline and the instrument, and its implementation is uncertain. Since Baseline mode requirements are a subset of Phase 1 pipeline mode requirements, we describe the calibration procedures and database products from the perspective of pipeline mode; variations for baseline mode will be noted as needed. The instructions for creating database entities can be used by observers to obtain necessary calibration images in baseline mode.
The calibration of certain properties require special slitmasks. These are described below, and their use is detailed in the following chapters.
In addition, there will be a number of slitmasks of astrometric fields used in slitmask astrometry.