Contents

• List of Figures
• List of Tables
• Part I: Overview and Summary
  • 1 Introduction and Overview
    • 1.1 Highlights of CDR Document
    • 1.2 Overall System Summary
    • 1.3 Changes to the Instrument
  • 2 Summary of Changes from the PDR
    • 2.1 Highlights of PDR Response
    • 2.2 Highlights of Chapter Changes to PDR
    • 2.3 Slitmasks (PDR Chap. 3)
    • 2.4 Mosaic Image Handling
      • 2.4.1 Mosaic Image Storage
      • 2.4.2 Mosaic Image Display
    • 2.5 Revised Database Scope
    • 2.6 Guider System & Object Acquisition (PDR Chap. 5)
    • 2.7 CCD Status
      • 2.7.1 MIT Lincoln Laboratory
      • 2.7.2 SITe
      • 2.7.3 EEV
      • 2.7.4 Summary
  • 3 Prerequisites: Items with Proofs of Concept
    • 3.1 Slitmasks Fabrication & Handling
    • 3.2 GUI and GUI design : the ``dashboard" application
      • 3.2.1 The ``Dashboard" application: a soft realtime GUI
      • 3.2.2 Proof of Concept
    • 3.3 Software Design and Documentation Tools
      • 3.3.1 Exploiting an Existing Resource
      • 3.3.2 A User Front End for Design Data
    • 3.4 Keywords in Database
    • 3.5 Software Infrastructure
      • 3.5.1 Software Maintenance
      • 3.5.2 Software Portability
      • 3.5.3 Software Installation
      • 3.5.4 Summary
    • 3.6 FITS File Interchange Formats
      • 3.6.1 Archival formats for FITS images
        • 3.6.1.1 Raw images
        • 3.6.1.2 Pipeline-processed images
      • 3.6.2 Operational formats
      • 3.6.3 Formats for FITS tables
        • 3.6.3.1 Object Catalog FITS Table
        • 3.6.3.2 Catalog File FITS Table
        • 3.6.3.3 Mask Design FITS Table
        • 3.6.3.4 Mask Blueprint FITS Table
        • 3.6.3.5 Slit/Object Map FITS Table
    • 3.7 Simulated DEIMOS Image
    • 3.8 Tests of SDSU 2nd Generation CCD H/W
    • 3.9 Instrument Control and Terminal Server Tests
      • 3.9.1 General hardware overview
      • 3.9.2 General software overview
      • 3.9.3 Lantronix testing
      • 3.9.4 Motor control tests
      • 3.9.5 Dispatcher interface and keyword tests
      • 3.9.6 Changes since PFCAM engineering run
      • 3.9.7 Summary
  • 4 Risk Items
    • 4.1 Image Display Plans
      • 4.1.1 Phase 1: Plan for Laboratory Testing
      • 4.1.2 Phase 2: Plan for Commissioning
      • 4.1.3 Contingencies
    • 4.2 Flexure Compensation System: Overview
      • 4.2.1 Motivation
      • 4.2.2 System Overview
    • 4.3 Calibration Stability
      • 4.3.1 Broadband Direct Imaging
        • 4.3.1.1 Fringing
          • Night-Sky Subtraction
          • Scattered Light
          • Flux Calibration of Celestial Sources
        • 4.3.1.2 Variable Vignetting
      • 4.3.2 Spectroscopy
        • 4.3.2.1 Fringing
        • 4.3.2.2 Variable Vignetting and Slit Losses
      • 4.3.3 Reducing Fringing Errors
  • A Response to Preliminary Design Review
    • A.1 Introduction
    • A.2 List of Important Issues
    • A.3 CDR Suggestions
    • A.4 Individual Reviewers' Comments
      • A.4.1 George Jacoby
      • A.4.2 Steve Kent
      • A.4.3 John Cromer
      • A.4.4 Jill Knapp
      • A.4.5 Al Conrad
      • A.4.6 George Jacoby II
    • A.5 Addendum: Initial Response to PDR Review Board Report
      • Section 2.4 of DEIMOS Quarterly Report Number, July, 1996
      • Budget and Schedule
      • CCD readout hardware and software
      • Early prototyping of user interface software
      • Software tools for quick look image display and reduction
      • Coordination with CARA
      • Allocation of effort towards general software infrastructure
      • Generation of simulated DEIMOS data
      • Plans for the next quarter
• Part II: Subsystem Designs
  • 1 Slitmask Design & Fabrication
    • 1.1 Overview
    • 1.2 Subsystem Figures
    • 1.3 Nomenclature
    • 1.4 Component Modules
      • 1.4.1 SIMULATOR
      • 1.4.2 MAPMASK
      • 1.4.3 FABMASK
      • 1.4.4 PLOTMASK
      • 1.4.5 SKYCOORDS
      • 1.4.6 MaskAcceptor
      • 1.4.7 MillControl
      • 1.4.8 MaskQuery
    • 1.5 Subsystem Procedures
      • 1.5.1 Pre-Commissioning
      • 1.5.2 Commissioning
      • 1.5.3 Operational Procedure
        • 1.5.3.1 Mask Fabrication
          • Hardware Components
          • Software Components
          • Slitmask Stock Check-in
          • Milling Setup
          • Milling Procedure
          • Quality Control Procedure
            • Responses of MillControl to a MaskId barcode
            • Responses of MillControl to various QC barcodes
          • Slitmask Stock Check-out
          • Retirement of Slitmask Stock and Data
    • 1.6 Deliverable Documents
  • 2 Acquisition & Slitmask Alignment
    • 2.1 Overview
    • 2.2 Subsystem Figures
    • 2.3 Nomenclature
    • 2.4 Component Modules
      • 2.4.1 XLATE
      • 2.4.2 SMALIGN
    • 2.5 Subsystem Procedures
      • 2.5.1 Commissioning
      • 2.5.2 Mask Initialization
      • 2.5.3 Mask Alignment Procedure
    • 2.6 Deliverable Documents
  • 3 Spectrograph Control
    • 3.1 Overview
    • 3.2 Figures
    • 3.3 Nomenclature
    • 3.4 Component Modules
      • 3.4.1 BEKINS
      • 3.4.2 UHAUL
      • 3.4.3 dispatch
      • 3.4.4 Galil DMC-1500 Dispatch I/O Library
      • 3.4.5 Bar Code Reader Dispatch I/O Library
      • 3.4.6 Piezo Controller Dispatch I/O Library
      • 3.4.7 Lantronics Terminal Server dispatch I/O Library
      • 3.4.8 watch_irot
      • 3.4.9 DEIMOS FIORD keyword library
      • 3.4.10 traffic
      • 3.4.11 KTL support libraries
      • 3.4.12 modify
      • 3.4.13 show
      • 3.4.14 waitfor
      • 3.4.15 xshow
    • 3.5 Subsystem Procedures
      • 3.5.1 Overall Instrument Control Data Flow
      • 3.5.2 Loading New Data and Programs onto Controllers
    • 3.6 Deliverable Documents
      • 3.6.1 Programmer's Manual
      • 3.6.2 Operations Manuals
  • 4 CCD Control
  • 5 Flexure Compensation
  • 6 Image Display
    • 6.1 Overview
    • 6.2 Figures
    • 6.3 Nomenclature
    • 6.4 Component Modules
      • 6.4.1 Data Capture Agent
    • 6.5 Subsystem Procedures
    • 6.6 Deliverable Documents
  • 7 Information Management
    • 7.1 Overview
      • 7.1.1 Documentation and Design
      • 7.1.2 User Interface
      • 7.1.3 Slitmask Fabrication and Management
      • 7.1.4 Performance and Failure Analysis
      • 7.1.5 Instrument Calibration, Pipeline Reduction, FCS
      • 7.1.6 Summary
    • 7.2 Figures
      • 7.2.1 Helpful Keys to Flow Diagrams
        • 7.2.1.1 Media Abbreviations
        • 7.2.1.2 Format Abbreviations
        • 7.2.1.3 Timing Abbreviations
        • 7.2.1.4 Agent Types
        • 7.2.1.5 Symbols used for Agent Types
    • 7.3 Database Nomenclature
    • 7.4 Component Modules
      • 7.4.1 CodeGen
      • 7.4.2 Dashboard
      • 7.4.3 Etcha
      • 7.4.4 Forms
      • 7.4.5 KTLwatch
      • 7.4.6 mbcFamily
      • 7.4.7 memestruct
      • 7.4.8 mhmFamily
      • 7.4.9 msanity
      • 7.4.10 PipeConfig
      • 7.4.11 stm
      • 7.4.12 traceFamily
      • 7.4.13 Wisql
    • 7.5 Subsystem Procedures
      • 7.5.1 Software Design/Documentation
      • 7.5.2 Instrument Calibration, Pipeline Reduction
      • 7.5.3 Slit Mask Fabrication and Management
      • 7.5.4 Performance and Failure Analysis
      • 7.5.5 General Data Maintenance
    • 7.6 Deliverable Documents
    • 7.7 Database Schema
  • 8 Environmental Monitoring and Logging
    • 8.1 Overview
      • 8.1.1 Robustness
      • 8.1.2 Event Logging and Response
      • 8.1.3 Parametric Logging
    • 8.2 Component Modules
      • 8.2.1 EngDataVisu
      • 8.2.2 KTLwatch
      • 8.2.3 ElectroLog
    • 8.3 Subsystem Procedures
      • 8.3.1 Data Capture
      • 8.3.2 Data Retrieval
    • 8.4 Deliverable Documents
  • 9 Acceptance Suite
• Part III: DEIMOS Calibration: Procedures and Database Requirements - DRAFT
  • 1 Glossary of Terms, Acronyms, and Symbols
  • 2 Coordinate Systems
    • 2.1 Overview of Coordinate Systems and Mappings
    • 2.2 Mathematical Expressions for Mappings
      • 2.2.1 FKCS RSCS:
      • 2.2.2 RSCS MF/SMCS:
      • 2.2.3 MF/SMCS ICS:
      • 2.2.4 ICS CCDCSi:
      • 2.2.5 MF/SMCS TVCS:
      • 2.2.6 Constants:
    • 2.3 Empirical Mappings
  • 3 Calibration Elements
    • 3.1 Detector Calibration
      • 3.1.1 Bias-Level:
      • 3.1.2 Bias-Structure:
      • 3.1.3 Dark Rate:
      • 3.1.4 Pixel-to-Pixel Flats:
      • 3.1.5 Large-scale Flats:
      • 3.1.6 Fringing:
      • 3.1.7 Cosmic Rays:
    • 3.2 Spatial Calibrations
      • 3.2.1 CCD Spatial Calibration
      • 3.2.2 Instrument Spatial Calibration
      • 3.2.3 Wavelength Calibration
    • 3.3 System Throughput & Instrumental Signature
  • 4 Overview of Data Procedures & Database Products
    • 4.1 Calibration Slitmasks
  • 5 Calibrations at Commissioning
    • 5.1 Background and Issues of Concern
    • 5.2 Database Products
      • 5.2.1 To create a slitmask astrometry map:
      • 5.2.2 To determine SM/MFCS to TVCS mapping:
      • 5.2.3 To determine relative alignment of CCDs:
    • 5.3 Other Products
    • 5.4 Outstanding Issues
  • 6 CCDs - Procedures & Database Products
    • 6.1 Background and Issues
    • 6.2 Procedures
    • 6.3 Database Products
      • 6.3.1 To create a bias-structure image:
      • 6.3.2 To create a dark-structure image:
    • 6.4 Other Products
    • 6.5 Outstanding issues
  • 7 Imaging - Procedures & Database Products
    • 7.1 Background and Issues
    • 7.2 Procedures
    • 7.3 Database Products
      • 7.3.1 To create a flat field image (method 1):
      • 7.3.2 To create a flat field image (method 2):
      • 7.3.3 To create a fringe frame:
      • 7.3.4 To measure system throughput:
      • 7.3.5 To create a distortion map:
      • 7.3.6 To create a differential update to distortion map:
    • 7.4 Other Products
    • 7.5 Outstanding Issues
  • 8 Spectroscopy - Procedures & Database Products
    • 8.1 Background and Issues
    • 8.2 Procedures
      • 8.2.1 Baseline Mode
      • 8.2.2 Pipeline Mode
    • 8.3 Database Products
      • 8.3.1 To create the database wavelength calibration:
      • 8.3.2 To create the database relative flux calibration:
      • 8.3.3 To create the database throughput calibration:
    • 8.4 Other Products
    • 8.5 Outstanding Issues
  • 9 Health & Stability of Instrument - Procedures
    • 9.0.1 Astrometric Stability
    • 9.0.2 Flatfield Stability
    • 9.0.3 Throughput
    • 9.0.4 Grating Angles???
    • 9.0.5 Database Products
    • 9.0.6 Other Products
    • 9.1 Outstanding Issues
• Part IV: Flexure Compensation
  • 1 Introduction
    • 1.1 Motivation
      • Image Quality
      • Calibration Accuracy
    • 1.2 Requirements
    • 1.3 System Overview
  • 2 Error Budget
    • 2.1 Photon Statistics
    • 2.2 Optical Distortions (partial draft)
      • 2.2.1 Displacement of the Optical Elements and the Detector
      • 2.2.2 Motions of Camera Lens Elements
    • 2.3 Error of the Applied Correction
    • 2.4 Uncorrected Errors
      • 2.4.1 Thermal Effects on Camera Image Scale
      • 2.4.2 Image Rotation
    • 2.5 Summary
  • 3 Arc Lamps
    • 3.1 Spectral Selection
    • 3.2 Expected Fluxes
    • 3.3 Scattered Light
  • 4 Optical Fibers
    • 4.1 Fiber Selection
    • 4.2 Fiber Illumination
    • 4.3 Fiber Focal Plane Mount
    • 4.4 Emitted Beam
  • 5 Signal Chain
    • 5.1 FC CCDs
    • 5.2 Preamplifiers, CCD Controller, VME Crate
  • 6 Duty Cycle
  • 7 Operating Modes
    • 7.1 Overview of Modes
    • 7.2 User GUI
    • 7.3 Monitor Mode
    • 7.4 Control Mode
• Part V: Budget and Schedule
  • 1 To Be Written
• Index
• About this document ...